The SEM laboratory is equipped with a scanning electron microscope set up with two detectors: one for imaging with secondary electrons, and one for imaging with backscattered electrons. Imaging with secondary electrons is used to study surfaces and provides topographic contrast. This detector gives the best lateral resolution. Imaging with backscattered electrons probes a little deeper in the sample (up to one µm) and provides element contrast (contrast of the atomic weight of an element).
EDX spectroscopy enables the identification of elements in the sample (for atomic weights down to Z = 6, carbon), and quantification of the proportion of each element.
The scientific equipment in the laboratories is funded partly by used equipment from the business sector and where the business sector has placed its own equipment in the university college’s laboratories. Most of the new equipment was purchased through support from the Research Council’s support scheme for scientific equipment, partly as a grant from the university college’s board of directors and partly from the Ministry of Education and Research as an extra award. The value of purchasing the existing equipment new is currently in the region of NOK 100 million. The university college will strive to obtain additional finance from the ministries, the Research Council and the business sector.
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